2024 3rd International Conference on Machine Vision, Automatic Identification and Detection (MVAID 2024)
About MVAID 2024

Welcome to the MVAID 2024


It’s our great pleasure to invite you to join us for the 2024 3rd International Conference on Machine Vision, Automatic Identification and Detection (MVAID 2024) [第三届机器视觉、自动识别与检测国际学术会议], which will be held on April 26-28, 2024 in Kunming, China. MVAID 2024 will provide a forum within the international academic and engineering community in the field of Machine Vision, Automatic Identification and Detection.

At the forefront of the global STI mega-trend, China has been creating an increasingly open STI environment, increasing the depth and breadth of academic collaboration, and building a community of innovation that benefits all. These efforts make a new contribution to globalization and the creation of a common community for the future.

The annually-held MVAID conference aims to gather professors, researchers, scholars and industrial pioneers all over the world. MVAID is the premier forum for the presentation and exchange of past experiences and new advances and research results in the field of theoretical and industrial experience. The conference welcomes contributions which promote the exchange of ideas and rational discourse between educators and researchers all over the world. The organizing committee of conference is pleased to invite prospective authors to submit their original manuscripts to MVAID 2024.


Important Dates

Paper submission deadline: March 29, 2024 

Registration Deadline: April 12, 2024

Conference Date: April 26-28, 2024



Publication

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All full paper submissions to the MVAID 2024 will be sent to at least two reviewers and evaluated based on originality, technical or research content or depth, correctness, relevance to conference, contributions, and readability. All accepted and registered papers will be published by SPIE - The International Society for Optical Engineering (ISSN: 0277-786X), which will be submitted to EI Compendex, Scopus for indexing.


image.pngMVAID 2023 proceedings have been  published  successfully and indexed bEI compendex and Scopus already!

MVAID 2023  | Hangzhou | April 14-16

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MVAID 2023 见刊记录

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MVAID 2023 检索记录

image.pngMVAID 2022 proceedings have been  published  successfully and indexed bEI compendex and Scopus already!

MVAID 2022  | Nanjing | April 22-24

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MVAID 2022 见刊记录

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MVAID 2022 检索记录



Call For Paper

Call For Paper

Topics of interest for submission include, but are not limited to:

Machine VisionAutomatic Identification and Detection Technology
Computer Vision 

Active Vision

3D-Vision
Machine Learning

Artificial Intelligence
Big data & Data mining

Deep Learning

Image Processing

......

Artificial Intelligence Techniques in Automatic Identification

Biometrics (including face recognition)

Document Processing and Recognition

Advanced Learning Methods

Linear Models and Dimensionality Reduction

Natural Language Processing and Recognition

face and gesture recognition

Image Forensics and Identification

......

More Topics...

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