It’s our great pleasure to invite you to join us for the 2022 International Conference on Machine Vision, Automatic Identification and Detection (MVAID 2022)[2022年机器视觉、自动识别与检测国际学术会议], which will be held on April 22-24, 2022 in Nanjing, China. MVAID 2022 will provide a forum within the international academic and engineering community in the field of Machine Vision, Automatic Identification and Detection.
The annually-held MVAID conference aims to gather professors, researchers, scholars and industrial pioneers all over the world. MVAID is the premier forum for the presentation and exchange of past experiences and new advances and research results in the field of theoretical and industrial experience. The conference welcomes contributions which promote the exchange of ideas and rational discourse between educators and researchers all over the world. The organizing committee of conference is pleased to invite prospective authors to submit their original manuscripts to MVAID 2022.
Affected by the epidemic of COVID-19 and other factors, we are sorry to inform you that we decided to postpone the 2022 International Conference on Machine Vision, Automatic Identification and Detection (MVAID 2022), originally scheduled for April 8-10, will be postponed to April 22-24 and will be held online.
All full paper submissions to the MVAID 2022 could be written in English and will be sent to at least two reviewers and evaluated based on originality, technical or research content or depth, correctness, relevance to conference, contributions, and readability. All accepted papers of MVAID 2022 will be published by Journal of Physics: Conference Series(ISSN: 1742-6596) and will be submitted to EI Compendex, Scopus for indexing.
*Official Chinese website：https://www.ais.cn/attendees/index/I7FV7V