Welcome to the MVAID 2023
It’s our great pleasure to invite you to join us for the 2023 2nd International Conference on Machine Vision, Automatic Identification and Detection (MVAID 2023) [第二届机器视觉、自动识别与检测国际学术会议], which will be held on April 14-16, 2023 in Hangzhou, China. MVAID 2023 will provide a forum within the international academic and engineering community in the field of Machine Vision, Automatic Identification and Detection.
At the forefront of the global STI mega-trend, China has been creating an increasingly open STI environment, increasing the depth and breadth of academic collaboration, and building a community of innovation that benefits all. These efforts make a new contribution to globalization and the creation of a common community for the future.
The annually-held MVAID conference aims to gather professors, researchers, scholars and industrial pioneers all over the world. MVAID is the premier forum for the presentation and exchange of past experiences and new advances and research results in the field of theoretical and industrial experience. The conference welcomes contributions which promote the exchange of ideas and rational discourse between educators and researchers all over the world. The organizing committee of conference is pleased to invite prospective authors to submit their original manuscripts to MVAID 2023.
Paper submission deadline: December 30, 2022
Registration Deadline: April 2nd, 2023
Conference Date: April 14-16, 2023
All accepted papers of MVAID 2023 will be published in the conference proceedings, which will be submitted to EI Compendex, Scopus for indexing.
MVAID 2022 proceedings have been published successfully and indexed by EI compendex and Scopus already!
|MVAID 2022 | Nanjing | April 22-24||Conference proceedings (Journal of Physics: Conference Series) Click!||Indexed by EI Compendex (Click!)|
Indexed by Scopus (Click!)
|Machine Vision||Automatic Identification and Detection Technology|
|Computer Vision |
|Artificial Intelligence Techniques in Automatic Identification|
Biometrics (including face recognition)
Document Processing and Recognition
Advanced Learning Methods
Linear Models and Dimensionality Reduction
Natural Language Processing and Recognition
face and gesture recognition
Image Forensics and Identification