The 2022 International Conference on Machine Vision, Automatic Identification and Detection (MVAID 2022) will be held on April 8-10, 2022 in Nanjing, China.
The annually-held MVAID conference aims to gather professors, researchers, scholars and industrial pioneers all over the world. MVAID is the premier forum for the presentation and exchange of past experiences and new advances and research results in the field of theoretical and industrial experience. The conference welcomes contributions which promote the exchange of ideas and rational discourse between educators and researchers all over the world. The organizing committee of conference is pleased to invite prospective authors to submit their original manuscripts to MVAID 2022.